Characterization of materials

Electron microscopy is a very useful technique in the characterization of materials since it requires very little sample quantity and it is a non-destructive and fast-responding technique, making it a powerful tool for the characterization of materials in a wide range of applications in numerous fields of science and industry. Among many other applications, it is used for:

  • Morphological, structural and chemical study of samples (components)
  • Determination of conductive – non-conductive particles
  • Determination of abrasive-non-abrasive particles
  • Product Design Failure Analysis
  • Defect Analysis & Quality Control

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SEM/EDX brings together a set of techniques that allow the morphological, structural, and compositional characterization of solid surfaces using images.
With the X-ray detector (EDX), micro-analysis, zonal and element mapping can be performed on the analyzed samples.

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